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ScanSingleRidge_Direct

Header:	FIL.h
Namespace:	fil
Module:	MetrologyBasic

Locates the strongest dark or bright pixel peak along a given path (without a scan map).

Applications: Very fast detection of a thin structure like a wire or a scale mark.

Syntax

void fil::ScanSingleRidge_Direct
(
	const fil::Image& inImage,
	const fil::Path& inScanPath,
	ftl::Optional<const fil::CoordinateSystem2D&> inScanPathAlignment,
	int inScanWidth,
	const fil::SamplingParams& inSamplingParams,
	const fil::RidgeScanParams& inRidgeScanParams,
	fil::Selection::Type inRidgeSelection,
	ftl::Optional<const fil::LocalBlindness&> inLocalBlindness,
	ftl::Conditional<fil::Ridge1D>& outRidge,
	ftl::Optional<fil::Path&> outAlignedScanPath = ftl::NIL,
	ftl::Optional<fil::Profile&> outBrightnessProfile = ftl::NIL,
	ftl::Optional<fil::Profile&> outResponseProfile = ftl::NIL,
	ftl::Array<fil::Path>& diagSamplingPoints,
	float& diagSamplingStep
)

Parameters

Name	Type	Range	Default	Description
inImage	const Image&			Input image
inScanPath	const Path&			Path along which the scan is performed
inScanPathAlignment	Optional<const CoordinateSystem2D&>		NIL	Adjusts the scan path to the position of the inspected object
inScanWidth	int	1 -	5	Width of the scan field in pixels
inSamplingParams	const SamplingParams&		SamplingParams ( Interpolation: Bilinear SamplingStep: 1.0f SampleCount: Nil )	Parameters controlling the sampling process
inRidgeScanParams	const RidgeScanParams&		RidgeScanParams ( ProfileInterpolation: Quadratic4 SmoothingStdDev: 0.6f RidgeWidth: 5 RidgeMargin: 2 MinMagnitude: 5.0f RidgePolarity: Dark )	Parameters controlling the ridge extraction process
inRidgeSelection	Selection::Type			Selection mode of the resulting ridge
inLocalBlindness	Optional<const LocalBlindness&>		NIL	Defines conditions in which weaker ridges can be detected in the vicinity of stronger ridges
outRidge	Conditional<Ridge1D>&			Found ridge
outAlignedScanPath	Optional<Path&>		NIL	Transformed input path
outBrightnessProfile	Optional<Profile&>		NIL	Extracted image profile
outResponseProfile	Optional<Profile&>		NIL	Profile of the ridge operator response
diagSamplingPoints	Array<Path>&			Array of paths each one containing the sampling points that contributes to a single value of the extracted profile
diagSamplingStep	float&			Used distance between consecutive sampling points on the scan path

Optional Outputs

The computation of following outputs can be switched off by passing value ftl::NIL to these parameters: outAlignedScanPath, outBrightnessProfile, outResponseProfile.

Description

The operation scans the image along inScanPath and locates the strongest ridge of the given characteristics. If there is no such ridge then the outputs are set to NIL.

The optional parameter inScanPathAlignment defines a transform to be performed on the inScanPath so that the actual scan path (outAlignedScanPath) is adjusted to the position of the object, typically detected by one of Template Matching filters.

Hints

Adjust inRidgeScanParams.RidgeWidth to the expected thickness of the ridge (in pixels).
Define inRidgeScanParams.RidgePolarity to detect a particular ridge type, and only that type.
If no ridge is found, try decreasing inRidgeScanParams.MinMagnitude.
For difficult cases try different settings of the inRidgeScanParams.RidgeOperator parameter.

Examples

ScanSingleRidge_Direct locates the strongest ridge across inScanPath.

Remarks

Read more about Local Coordinate Systems in Machine Vision Guide: Local Coordinate Systems.

This filter is a part of the 1D Edge Detection toolset. For a comprehensive introduction to this technique please refer to 1D Edge Detection and 1D Edge Detection - Subpixel Precision chapters of our Machine Vision Guide.

Hardware Acceleration

This operation is optimized for SSE2 technology for pixels of type: UINT8.

This operation is optimized for AVX2 technology for pixels of type: UINT8.

This operation is optimized for NEON technology for pixels of type: UINT8.

This operation supports automatic parallelization for multicore and multiprocessor systems.